HOME | E-MAIL COMPANY Greetings Overview History Business Quality Goal Development TECHNOLOGY Applications Features Image Processing Safety PRODUCT ARRAY CT SYSTEM CT CR DR UTI GALLERY 2D+3D Images CT Images Glossary CONTACT Domestic Overseas Location SERVICE Sample Test / Analysis A/S Request

SM Series is easy to move because its monitor and system controller are attached to system body. The height can be adjusted according to the user's height. The location of the test sample is clearly and accurately marked by red laser point. The super-precision LED Monitor displays high-definition and high-magnification image to make it easy to conduct inspection, using Mouse Control. 4800X magnificence and 0.1§­ are possible. Moving speed can be controlled, ranging from the high speed of 0 ~80mm/sec to the low of 0.5 mm/sec. CT / Via Hole CT / BGA

Amfis X-Ray Co.,Ltd. #2609. IS BIZ Tower 1-1, YangPyeong-Dong 5-Ga, YeongDeungpo-Gu, Seoul, Korea Tel : 82-2-839-7360, Fax : 82-2-839-7366 Copyright (c) Amfis X-Ray Co.,Ltd. Allrights Reserved.